Memory Test System
High throughput testing of DRAMs and flash memory
The T5371 provides various functions which work to dramatically reduce test costs. Its DRAM/SRAM testing function is capable of simultaneous testing up to 64 units of large capacity, 18 or 20 bit wide memory devices. The system also has a flash memory function that prevents excessive writing and erasing. It also allows testing of defective blocks on a block-by-block basis and independent control of the mask feature on every DUT. When testing flash memories (x8/x9 bit), it is capable of simultaneous testing up to 128 devices.
| Target Devices | DRAMs, SDRAMs, CDRAMs, SRAMs, flash memories, Direct RDRAMs, EPROMs, Masked ROMs, etc |
| Test Speed | 70 MHz |
| Overall Timing Accuracy | +/-800 ps |
| Simultaneous Testing | Up to 128 devices (x8 or x9 bits) |
| Test Heads | Up to two stations HV driver comes standard |
| Timing Generation | 27 timing edges/pin (and/or) 16 timing sets/pin |
| DC Test Units | Up to 32 units/station |
| Programmable Power Supply | Up to 128 units/station |
| Options | MRA4 (Memory Repair Analyzer) or AFM |